Atomic force microscopy as a tool for asymmetric polymeric membrane characterization

Atomic force microscopy (AFM) has a wide range of applications and is rapidly growing in research and development. This powerful technique has been used to visualize surfaces both in liquid or gas media. It has been considered as an effective tool to investigate the surface structure for its ability...

Full description

Saved in:
Bibliographic Details
Main Authors: Abdul Wahab Mohammad, Nidal Hilal, Lim, Ying Pei, Indok Nurul Hasyimah Mohd Amin, Rafeqah Raslan
Format: Article
Language:en
Published: Universiti Kebangsaan Malaysia 2011
Online Access:http://journalarticle.ukm.my/704/1/08_Abdul_Wahab.pdf
http://journalarticle.ukm.my/704/
http://www.ukm.my/~jsm/
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1831353054056677376
author Abdul Wahab Mohammad,
Nidal Hilal,
Lim, Ying Pei
Indok Nurul Hasyimah Mohd Amin,
Rafeqah Raslan,
author_facet Abdul Wahab Mohammad,
Nidal Hilal,
Lim, Ying Pei
Indok Nurul Hasyimah Mohd Amin,
Rafeqah Raslan,
author_sort Abdul Wahab Mohammad,
building Tun Sri Lanang Library
collection Institutional Repository
content_provider Universiti Kebangsaan Malaysia
content_source UKM Journal Article Repository
continent Asia
country Malaysia
description Atomic force microscopy (AFM) has a wide range of applications and is rapidly growing in research and development. This powerful technique has been used to visualize surfaces both in liquid or gas media. It has been considered as an effective tool to investigate the surface structure for its ability to generate high-resolution 3D images at a subnanometer range without sample pretreatment. In this paper, the use of AFM to characterize the membrane roughness is presented for commercial and self-prepared membranes for specific applications. Surface roughness has been regarded as one of the most important surface properties, and has significant effect in membrane permeability and fouling behaviour. Several scan areas were used to compare surface roughness for different membrane samples. Characterization of the surfaces was achieved by measuring the average roughness (Ra) and root mean square roughness (Rrms) of the membrane. AFM image shows that the membrane surface was composed entirely of peaks and valleys. Surface roughness is substantially greater for commercial available hydrophobic membranes, in contrast to self-prepared membranes. This study also shows that foulants deposited on membrane surface would increase the membrane roughness.
format Article
id my-ukm.journal-704
institution Universiti Kebangsaan Malaysia
language en
publishDate 2011
publisher Universiti Kebangsaan Malaysia
record_format eprints
spelling my-ukm.journal-7042016-12-14T06:27:57Z http://journalarticle.ukm.my/704/ Atomic force microscopy as a tool for asymmetric polymeric membrane characterization Abdul Wahab Mohammad, Nidal Hilal, Lim, Ying Pei Indok Nurul Hasyimah Mohd Amin, Rafeqah Raslan, Atomic force microscopy (AFM) has a wide range of applications and is rapidly growing in research and development. This powerful technique has been used to visualize surfaces both in liquid or gas media. It has been considered as an effective tool to investigate the surface structure for its ability to generate high-resolution 3D images at a subnanometer range without sample pretreatment. In this paper, the use of AFM to characterize the membrane roughness is presented for commercial and self-prepared membranes for specific applications. Surface roughness has been regarded as one of the most important surface properties, and has significant effect in membrane permeability and fouling behaviour. Several scan areas were used to compare surface roughness for different membrane samples. Characterization of the surfaces was achieved by measuring the average roughness (Ra) and root mean square roughness (Rrms) of the membrane. AFM image shows that the membrane surface was composed entirely of peaks and valleys. Surface roughness is substantially greater for commercial available hydrophobic membranes, in contrast to self-prepared membranes. This study also shows that foulants deposited on membrane surface would increase the membrane roughness. Universiti Kebangsaan Malaysia 2011-03 Article PeerReviewed application/pdf en http://journalarticle.ukm.my/704/1/08_Abdul_Wahab.pdf Abdul Wahab Mohammad, and Nidal Hilal, and Lim, Ying Pei and Indok Nurul Hasyimah Mohd Amin, and Rafeqah Raslan, (2011) Atomic force microscopy as a tool for asymmetric polymeric membrane characterization. Sains Malaysiana, 40 (3). pp. 237-244. ISSN 0126-6039 http://www.ukm.my/~jsm/
spellingShingle Abdul Wahab Mohammad,
Nidal Hilal,
Lim, Ying Pei
Indok Nurul Hasyimah Mohd Amin,
Rafeqah Raslan,
Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title_full Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title_fullStr Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title_full_unstemmed Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title_short Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title_sort atomic force microscopy as a tool for asymmetric polymeric membrane characterization
url http://journalarticle.ukm.my/704/1/08_Abdul_Wahab.pdf
http://journalarticle.ukm.my/704/
http://www.ukm.my/~jsm/
url_provider http://journalarticle.ukm.my/