Management of technology: a case study of cost deduction in multi - site testing for the semiconductor industry
With the increasing demand for high-complexity consumer Electronic products, the design of New Semiconductor chips needs to provide the required flexibility and speed. This trend shows that the functionality built into a single Semiconductor chip has continuously improved compared to the function...
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| Format: | Thesis |
| Language: | en en |
| Published: |
2013
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| Subjects: | |
| Online Access: | http://ur.aeu.edu.my/120/1/Management%20of%20technology%3B%20a%20case%20study%20of%20cost%20deduction%20in%20multi%20-%20site%20testing%20for%20the%20semiconductor%20industry-1-24.pdf http://ur.aeu.edu.my/120/2/Management%20of%20technology%3B%20a%20case%20study%20of%20cost%20deduction%20in%20multi%20-%20site%20testing%20for%20the%20semiconductor%20industry.pdf http://ur.aeu.edu.my/120/ |
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| Summary: | With the increasing demand for high-complexity consumer Electronic products, the
design of New Semiconductor chips needs to provide the required flexibility and speed.
This trend shows that the functionality built into a single Semiconductor chip has
continuously improved compared to the functionality 20 years ago. In contrast, Testing
Costs in Semiconductor industries today can reach a substantial percent of the total
Manufacturing Cost, thus affecting the Profit Margin.
Numerous approaches have been introduced to lessen Testing Costs; one of them is the
Multi-site Testing. Two case studies were conducted to determine the effectiveness of
Multi-site Testing in reducing Testing Costs. To achieve the research goal, a Multi-site
test Cost Model and Profit Model was developed using the test Cost economic Model
developed by Evan (1999) based on the economic theory of the firm, and by integrating
important elements including economic Profit Margin and technology Multi-site
efficiency. These models enabled the researcher to measure the capabilities of the Multisite
Testing for the Cost of Test Deduction and it effectiveness in relation to improving
the Profit Margin.
The case studies were conducted on two types of Test-equipment, namely, Wafer-Ring
and Pick-and-Place Test-equipment setup. Five Multi-site configurations were configured
on both Test-equipment setups for comparison. Testing time, Indexing time, and Test
yield-data were collected for the purpose of establishing the Testing Cost and calculating
the Profit Margin. Four hypotheses were tendered to analyze the performance of the Testequipment
setup, including Multi-site versus Multi-site efficiency, Multi-site versus
Testing throughput, Multi-site versus Testing Cost, and Multi-site versus Profit Margin
improvement. The findings were analyzed using one-way ANOVA, Post-hoc test, and
factorial ANOVA.
This research established that increasing the number of test sites is not sufficient to
guarantee reduced Testing Cost while maintaining Profit Margin because, once the
number of test sites increases correspondingly, the Testing time will increase as well. It is
therefore proposed that future work be conducted on the Multi-site Testing Approach
together with other Testing Approaches that can reduce Testing time, such as concurrent
Testing. |
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