Khoo, V. C. (2015). A Cost of Test Case Study for Wafer-Ring Multi-Sites Test Handler in Semiconductor’s Industry Through Theory of The Firm.
Chicago Style (17th ed.) CitationKhoo, Voon Ching. A Cost of Test Case Study for Wafer-Ring Multi-Sites Test Handler in Semiconductor’s Industry Through Theory of The Firm. 2015.
MLA (9th ed.) CitationKhoo, Voon Ching. A Cost of Test Case Study for Wafer-Ring Multi-Sites Test Handler in Semiconductor’s Industry Through Theory of The Firm. 2015.
Warning: These citations may not always be 100% accurate.