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    Structural properties studies of GaN on 6H-SiC by means of X-ray diffraction technique

    Structural properties studies of GaN on 6H-SiC by means of X-ray diffraction technique by C. G., Ching, S. S., Ng, Z., Hassan, H., Abu Hassan

    Published 2010
    Other Authors: “…cgching17@yahoo.com…”
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