Search Results - Soon, S. Y.
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Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET by Hatta, Sharifah Wan M., Hussin, Hanim Yati, Soon, F.Y., Abdul Wahab, Yasmin, Abdul Hadi, Dayanasari, Soin, Norhayati, Alam, A. H.M.Zahirul, Nordin, Anis Nurashikin
Published 2017Get full text
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Proceeding Paper -
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Reversal of cardiac damage in patients with symptomatic severe aortic stenosis following transcatheter aortic valve implantation: An echocardiographic study by Chung, B.K., Chan, En Ze, Thien, L.K., Chan, D. S. T., Khor, H. K., Shu, F.E.P., Ling, Hwei Sung, Chow, H.B., Jong, Sin Yen, Soon, S. Y., Koh, K.T., Cham, Y.L., Asri, Said, Fong, A.Y.Y., Ong, T.K.
Published 2022Get full text
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