Search Results - Siddiqui, Naseeb
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Radiation-induced degradation of silicon carbide MOSFETs – a review by Baba, Tamana, Siddiqui, Naseeb Ahmed, Saidin, Norazlina, Md Yusoff, Siti Harwani, Abdul Sani, Siti Fairus, Abdul Karim, Julia, Hasbullah, Nurul Fadzlin
Published 2024Get full text
Get full text
Get full text
Get full text
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