Search Results - Reaz, B. I.

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    Design Methodology to Achieve Good Testability of VLSI Chips: An Industrial Perspective

    Design Methodology to Achieve Good Testability of VLSI Chips: An Industrial Perspective by Lo, Hai Hiung, Lee, Weng Fook, Reaz, B. I., Hamid, Nor Hisham

    Published 2009
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