Search Results - Ramzan Mat Ayub (Advisor)

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  1. 1
    Gate Oxide Integrity (GOI) Characterization For Deep Submicron CMOS Device

    Gate Oxide Integrity (GOI) Characterization For Deep Submicron CMOS Device by Norain Mohd Saad

    Published 2008
    Other Authors: “…Ramzan Mat Ayub (Advisor)…”
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  2. 2
    Polysilicon Process Development – The Effect Of PECVD Process Parameters On The Film Characteristics

    Polysilicon Process Development – The Effect Of PECVD Process Parameters On The Film Characteristics by Mujahidun Mashuri

    Published 2008
    Other Authors: “…Ramzan Mat Ayub (Advisor)…”
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  3. 3
    The study of the effect of MOS transistor scaling on the critical device parameters

    The study of the effect of MOS transistor scaling on the critical device parameters by Zazurina Abd Rahman

    Published 2008
    Other Authors: “…Ramzan Mat Ayub (Advisor)…”
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  4. 4
    The Effect of Process Parameters on Metal Step Coverage for Aluminum by Evaporation Technique

    The Effect of Process Parameters on Metal Step Coverage for Aluminum by Evaporation Technique by Noraishah Azman

    Published 2008
    Other Authors: “…Ramzan Mat Ayub (Advisor)…”
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