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    DLTS and C(t) transient study of defects induced by neutron radiation in MOS structures of CCD technology

    DLTS and C(t) transient study of defects induced by neutron radiation in MOS structures of CCD technology by Ahaitouf, Aziz, Bakhtiar, Hazri, Losson, Etienne, Charles, Jean-Pierre

    Published 2003
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