Search Results - Lee, Weng Fook

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  1. 1
    Implementation Results on Register Bypass Conditions of an n-Parallel Pipes Superscalar Pipeline Microprocessor Core on FPGA

    Implementation Results on Register Bypass Conditions of an n-Parallel Pipes Superscalar Pipeline Microprocessor Core on FPGA by Lee, Weng Fook, Halim, Azrul, Hamid, Nor Hisham, Yap, Vooi Voon, Lo, Hai Huing, Sebastian , Patrick

    Published 2007
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  2. 2
    Design Methodology to Achieve Good Testability of VLSI Chips: An Industrial Perspective

    Design Methodology to Achieve Good Testability of VLSI Chips: An Industrial Perspective by Lo, Hai Hiung, Lee, Weng Fook, Reaz, B. I., Hamid, Nor Hisham

    Published 2009
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  3. 3
    A Review Paper On Memory Fault Models And Test Algorithms

    A Review Paper On Memory Fault Models And Test Algorithms by Hussin, Razaidi, Jidin, Aiman Zakwan, Lee, Weng Fook, Mispan, Mohd Syafiq

    Published 2021
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  4. 4
    Novel March WY approach for dynamic fault detection in memory BIST

    Novel March WY approach for dynamic fault detection in memory BIST by Loh, Wan Ying, Lee, Weng Fook, Hussin, Razaidi, Jidin, Aiman Zakwan, Ahmad, Norhawati, Zakaria, Nor Azura

    Published 2023
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  5. 5
    Automatic generation of user-defined test algorithm description file for memory BIST implementation

    Automatic generation of user-defined test algorithm description file for memory BIST implementation by Hussin, Razaidi, Jidin, Aiman Zakwan, Loh, Wan Ying, Mispan, Mohd Syafiq, Lee, Weng Fook

    Published 2022
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  6. 6
    Generation of new low-complexity March algorithms for optimum faults detection in SRAM

    Generation of new low-complexity March algorithms for optimum faults detection in SRAM by Jidin, Aiman Zakwan, Hussin, Razaidi, Lee, Weng Fook, Mispan, Mohd Syafiq, Zakaria, Nor Azura, Loh, Wan Ying, Zamin, Norshuhani

    Published 2023
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  7. 7
    A new 13N-complexity memory built-in self-test algorithm to balance static random access memory static fault coverage and test time

    A new 13N-complexity memory built-in self-test algorithm to balance static random access memory static fault coverage and test time by Jidin, Aiman Zakwan, Hussin, Razaidi, Mispan, Mohd Syafiq, Lee, Weng Fook

    Published 2025
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  8. 8
    Implementing a large data bus VLIW microprocessor

    Implementing a large data bus VLIW microprocessor by Lee, Weng Fook, Ali Yeon, Md Shakaff

    Published 2009
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  9. 9
    Research of large bit size superscalar pipeline VLIW microprocessor

    Research of large bit size superscalar pipeline VLIW microprocessor by Lee, Weng Fook, Ali Yeon, Md Shakaff

    Published 2009
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  10. 10
    A novel large-bit-size architecture and microarchitecture for the implementation of Superscalar Pipeline VLIW microprocessors

    A novel large-bit-size architecture and microarchitecture for the implementation of Superscalar Pipeline VLIW microprocessors by Lee, Weng Fook

    Published 2008
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