Search Results - Hai, H. Lo

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    High Degree of Testability Using Full Scan Chain and ATPG: An Industrial Perspective

    High Degree of Testability Using Full Scan Chain and ATPG: An Industrial Perspective by B. I. Reaz, Mamun, F. Lee, Weng, Hamid, Nor Hisham, Hai, H. Lo, Y. M. Shakaff, Ali

    Published 2009
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