Search Results - Goh K.H.

Physical and electrical properties of thermal oxidized Sm2O3 gate oxide thin film on Si substrate: Influence of oxidation durations by Goh, K.H., Haseeb, A.S. Md. Abdul, Wong, Y.H.

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Lanthanide rare earth oxide thin film as an alternative gate oxide by Goh, K.H., Haseeb, A.S. Md. Abdul, Wong, Y.H.

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Effect of Oxidation Temperature on Physical and Electrical Properties of Sm2O3 Thin-Film Gate Oxide on Si Substrate by Goh, K.H., Haseeb, A.S. Md. Abdul, Wong, Y.H.

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Structural characteristics of samarium oxynitride on silicon substrate by Goh, K.H., Haseeb, A.S. Md. Abdul, Wong, Y.H.

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Investigation of the effect of anodization time and annealing temperature on the physical properties of ZrO2 thin film on a Si substrate by Goh K.H., Lee H.J., Lau S.K., Teh P.C., Ramesh S., Tan C.Y., Wong Y.H.