Search Results - Goh, K.H.

Physical and electrical properties of thermal oxidized Sm2O3 gate oxide thin film on Si substrate: Influence of oxidation durations by Goh, K.H., Haseeb, A.S. Md. Abdul, Wong, Y.H.

Get full text
Get full text

Lanthanide rare earth oxide thin film as an alternative gate oxide by Goh, K.H., Haseeb, A.S. Md. Abdul, Wong, Y.H.

Get full text
Get full text

Effect of Oxidation Temperature on Physical and Electrical Properties of Sm2O3 Thin-Film Gate Oxide on Si Substrate by Goh, K.H., Haseeb, A.S. Md. Abdul, Wong, Y.H.

Get full text
Get full text

Structural characteristics of samarium oxynitride on silicon substrate by Goh, K.H., Haseeb, A.S. Md. Abdul, Wong, Y.H.

Get full text
Get full text

Investigation of the effect of anodization time and annealing temperature on the physical properties of ZrO2 thin film on a Si substrate by Goh K.H., Lee H.J., Lau S.K., Teh P.C., Ramesh S., Tan C.Y., Wong Y.H.