Search Results - Fauzi I.B.A.

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    Influence of process parameters on threshold voltage and leakage current in 18nm NMOS device

    Influence of process parameters on threshold voltage and leakage current in 18nm NMOS device by Atan N.B., Ahmad I.B., Majlis B.B.Y., Fauzi I.B.A.

    Published 2023
    Conference Paper
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