Search Results - Chin, J.F.

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  1. 1
    Modified short-run statistical process control for test and measurement process

    Modified short-run statistical process control for test and measurement process by Koh, C.K., Chin, J.F., Kamaruddin, S.

    Published 2019
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  2. 2
    Modified SPC for short run test and measurement process in multi-stations

    Modified SPC for short run test and measurement process in multi-stations by Koh, C.K., Chin, J.F., Kamaruddin, S.

    Published 2018
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  3. 3
    Fundamental simulation studies of CONWIP in front-end wafer fabrication

    Fundamental simulation studies of CONWIP in front-end wafer fabrication by Muhammad, N.A., Chin, J.F., Kamarrudin, S., Chik, M.A., Prakash, J.

    Published 2015
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  4. 4
    Fundamental simulation studies of CONWIP in front-end wafer fabrication

    Fundamental simulation studies of CONWIP in front-end wafer fabrication by Muhammad, N.A., Chin, J.F., Kamarrudin, S., Chik, M.A., Prakash, J.

    Published 2015
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  5. 5
    Automating computer simulation and statistical analysis in production planning and control research

    Automating computer simulation and statistical analysis in production planning and control research by Chin, J.F., Prakash, J., Kamaruddin, S., Tan, M.C.L.

    Published 2018
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  6. 6
    Automating computer simulation and statistical analysis in production planning and control research

    Automating computer simulation and statistical analysis in production planning and control research by Chin, J.F., Prakash, J., Kamaruddin, S., Tan, M.C.L.

    Published 2018
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  7. 7
    Modified short-run statistical process control for test and measurement process

    Modified short-run statistical process control for test and measurement process by Koh, C.K., Chin, J.F., Kamaruddin, S.

    Published 2019
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