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    Enhanced reliability of vertical strained impact ionization MOSFET incorporating dielectric pocket for ultra-sensitive biosensor applications

    Enhanced reliability of vertical strained impact ionization MOSFET incorporating dielectric pocket for ultra-sensitive biosensor applications by Ismail Saad, Mohd Zuhir Hamzah, Andee Hazwani Syazana Bacho, C., Bun Seng, A. M. Khairul, Bablu K. Ghosh, Nurmin Bolong

    Published 2017
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