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Abd. Hadi, D.
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1
Laser Anneal-Induced Effects on the NBTI Degradation of Advanced-Process 45nm high-k PMOS
by
Wan Muhamad Hatta, S.F.
,
Abd. Hadi, D
.
,
Soin, N.
Published 2011
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2
NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations
by
Hatta, S.F.W.M.
,
Soin, N.
,
Abd Hadi, D
.
,
Zhang, J.F.
Published 2010
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3
NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process.
by
Wan Muhamad Hatta, S.F.
,
Soin, N.
,
Abd Hadi, D
.
,
Zhang, J.F.
Published 2010
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