Search Results - Abd Hadi, D.

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    Laser Anneal-Induced Effects on the NBTI Degradation of Advanced-Process 45nm high-k PMOS

    Laser Anneal-Induced Effects on the NBTI Degradation of Advanced-Process 45nm high-k PMOS by Wan Muhamad Hatta, S.F., Abd. Hadi, D., Soin, N.

    Published 2011
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  2. 2
    NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations

    NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations by Hatta, S.F.W.M., Soin, N., Abd Hadi, D., Zhang, J.F.

    Published 2010
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  3. 3
    NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process.

    NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process. by Wan Muhamad Hatta, S.F., Soin, N., Abd Hadi, D., Zhang, J.F.

    Published 2010
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