Mohd Fazil, A. F. (2019). Evaluation of machine learning classifiers in faulty die prediction to maximize cost scrapping avoidance and assembly test capacity savings in semiconductor integrated circuit (IC) manufacturing. AIP Publishing LLC.
Chicago Style CitationMohd Fazil, Azlan Faizal. Evaluation of Machine Learning Classifiers in Faulty Die Prediction to Maximize Cost Scrapping Avoidance and Assembly Test Capacity Savings in Semiconductor Integrated Circuit (IC) Manufacturing. AIP Publishing LLC, 2019.
MLA引文Mohd Fazil, Azlan Faizal. Evaluation of Machine Learning Classifiers in Faulty Die Prediction to Maximize Cost Scrapping Avoidance and Assembly Test Capacity Savings in Semiconductor Integrated Circuit (IC) Manufacturing. AIP Publishing LLC, 2019.