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Defect depth estimation in passive thermography using neural network paradigm

Defect depth estimation from passive thermography data based on neural network paradigm is proposed. Three parameters have been found to be related with depth of the defect. Therefore, these parameters: the maximum temperature over the defective area (T-max), the temperature on the non-defective or...

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書誌詳細
主要な著者:	Heriansyah, Rudi, Syed Abu Bakar, Syed Abdul Rahman
フォーマット:	Conference or Workshop Item
出版事項:	2007
主題:	TK Electrical engineering. Electronics Nuclear engineering
オンライン･アクセス:	http://eprints.utm.my/id/eprint/8628/
タグ:	タグ追加タグなし, このレコードへの初めてのタグを付けませんか!

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