Defect depth estimation in passive thermography using neural network paradigm
Defect depth estimation from passive thermography data based on neural network paradigm is proposed. Three parameters have been found to be related with depth of the defect. Therefore, these parameters: the maximum temperature over the defective area (T-max), the temperature on the non-defective or...
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| 主要な著者: | , |
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| フォーマット: | Conference or Workshop Item |
| 出版事項: |
2007
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| 主題: | |
| オンライン･アクセス: | http://eprints.utm.my/id/eprint/8628/ |
| タグ: |
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