Artifact removal from single-trial ERPs using non-Gaussian stochastic volatility models and particle filter
This paper considers improved modeling of artifactual noise for denoising of single-trial event-related potentials (ERPs) by state-space approach. Instead of the inadequate constant variance models used in existing studies, we propose to use stochastic volatility (SV) models to better describe the t...
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| 主要な著者: | , , , |
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| フォーマット: | 論文 |
| 出版事項: |
Institute of Electrical and Electronics Engineers Inc.
2014
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| 主題: | |
| オンライン･アクセス: | http://eprints.utm.my/id/eprint/51923/ http://dx.doi.org/10.1109/LSP.2014.2321000 |
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