A knowledge diagnostic system for porduct defects

The need to fulfill customer satisfaction and increase product quality has motivated many manufacturing firms to investigate and diagnose their product failure. To gain a correct and accurate diagnostic, the entire processing root must be recorded and controlled in every step of the manufacturing pr...

詳細記述

保存先:
書誌詳細
主要な著者: Salim, Naomie, Kuan, Yew Wong, Okfalisa, Okfalisa
フォーマット: Conference or Workshop Item
出版事項: 2007
主題:
オンライン・アクセス:http://eprints.utm.my/id/eprint/24435/
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