LoSS detection using parameter's adjustment based on second order self-similarity statistical model
This paper analyzes Loss of Self-Similarity (LoSS) detection accuracy using parameter's adjustment which includes different values of sampling level and correlation lag. This is important when considering exact and asymptotic self-similar models concurrently in the self-similarity parameter est...
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| 主要な著者: | , , , |
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| フォーマット: | Book Section |
| 出版事項: |
Institute of Electrical and Electronics Engineers
2008
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| 主題: | |
| オンライン･アクセス: | http://eprints.utm.my/id/eprint/12627/ http://dx.doi.org/10.1109/ITSIM.2008.4632041 |
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