Generation of new low-complexity March algorithms for optimum faults detection in SRAM
Memory BIST implements March test techniques extensively for testing embedded memories on a chip. A high-complexity test algorithm like the March MSS (18N) can guarantee the detection of all unlinked static faults in SRAM. In contrast, March algorithms with lower complexity can be used to reduce tes...
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| 主要な著者: | , , , , , , |
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| フォーマット: | 論文 |
| 言語: | English |
| 出版事項: |
Institute Of Electrical And Electronics Engineers Inc.
2023
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| オンライン･アクセス: | http://eprints.utem.edu.my/id/eprint/27493/2/0260402082023.PDF http://eprints.utem.edu.my/id/eprint/27493/ https://ieeexplore.ieee.org/document/9984966 |
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