Ahmad, I. (2017). Characterisation of polysilicon gate microstructures for 0.5 μm CMOS devices using transmission electron microscopy and atomic force microscopy images.
シカゴスタイル引用形Ahmad, I. Characterisation of Polysilicon Gate Microstructures for 0.5 μm CMOS Devices Using Transmission Electron Microscopy and Atomic Force Microscopy Images. 2017.
MLA引用形式Ahmad, I. Characterisation of Polysilicon Gate Microstructures for 0.5 μm CMOS Devices Using Transmission Electron Microscopy and Atomic Force Microscopy Images. 2017.
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