Akbar, M. A. (2025). Deep learning-based yield prediction for the die bonding semiconductor manufacturing process. Springer.
Chicago Style CitationAkbar, Muhammad Ali. Deep Learning-based Yield Prediction for the Die Bonding Semiconductor Manufacturing Process. Springer, 2025.
MLA引文Akbar, Muhammad Ali. Deep Learning-based Yield Prediction for the Die Bonding Semiconductor Manufacturing Process. Springer, 2025.
警告:这些引文格式不一定是100%准确.